JAIST Repository >
School of Materials Science >
Articles >
Journal Articles >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/12062

Title: Highly Oriented Sulfonic Acid Groups in a Nafion Thin Film on Si Substrate
Authors: Nagao, Yuki
Keywords: Proton conductivity
Multiple-angle incidence resolution spectrometry
Molecular oriented structure
Issue Date: 2013-02-07
Publisher: American Chemical Society
Magazine name: Journal of Physical Chemistry C
Volume: 117
Number: 7
Start page: 3294
End page: 3297
DOI: 10.1021/jp311622p
Abstract: Solid state ionics is a research field attracting much current attentions because of the ideal power sources for use with portable electronic devices having high power-to-weight ratios. One of the most urgent subjects in this field is to understand proton transport properties at the interface between inorganic materials and polymer electrolyte from the viewpoint of developing much more powerful energy. In this study, a 150-nm-thick Nafion thin film was prepared by spincoating on a silicon (Si) substrate to investigate the proton transport property at the interface. The infrared (IR) p-polarized multiple-angle incidence resolution spectrometry (p-MAIRS) technique was applied to investigate the in-plane (IP) and out-of-plane (OP) spectra to the surface. The IP spectrum showed a well-known spectrum, but the OP spectrum was quite different from the IP spectrum. An anomalous IR peak was observed in the OP spectrum at 1260 cm^<–1>. From density functional theory (DFT) calculations, this peak was attributed to the −SO_3H vibration modes between two sulfonic acid groups with hydrogen bonds. These results demonstrate that the Nafion thin film on Si substrate had a highly oriented structure with the sulfonic acid groups at the side chain. Impedance measurements of Nafion thin film were conducted to investigate the proton transport property of the Nafion thin film on SiO_2 substrate. The proton conductivity of the thin film exhibited a lower value than that of the commercial Nafion membrane. The low proton conductivity of the Nafion thin film was related with these highly oriented structures.
Rights: Yuki Nagao, Journal of Physical Chemistry C, 2013, 117(7), pp.3294-3297. This document is the unedited author's version of a Submitted Work that was subsequently accepted for publication in Langmuir, copyright (c) American Chemical Society after peer review. To access the final edited and published work, see [http://pubs.acs.org/articlesonrequest/AOR-AVVpyuGrFBbkVIQADUFp].
URI: http://hdl.handle.net/10119/12062
Material Type: author
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

Files in This Item:

File Description SizeFormat
jphyschm_authorversion.pdf211KbAdobe PDFView/Open

All items in DSpace are protected by copyright, with all rights reserved.


Contact : Library Information Section, Japan Advanced Institute of Science and Technology