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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/12895

Title: Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy
Authors: Ooe, Hiroaki
Sakuishi, Tatsuya
Nogami, Makoto
Tomitori, Masahiko
Arai, Toyoko
Issue Date: 2014-07-30
Publisher: American Institute of Physics
Magazine name: Applied Physics Letters
Volume: 105
Number: 4
Start page: 043107-1
End page: 043107-4
DOI: 10.1063/1.4891882
Abstract: Based on a two-prong type quartz tuning fork, a force sensor with a high Q factor, which we call a retuned fork sensor, was developed for non-contact atomic force microscopy (nc-AFM) with atomic resolution. By cutting a small notch and attaching an AFM tip to one prong, its resonance frequency can be retuned to that of the other intact prong. In balancing the two prongs in this manner, a high Q factor (>50 000 in ultrahigh vacuum) is obtained for the sensor. An atomic resolution image of the Si(111)-7 × 7 surface was demonstrated using an nc-AFM with the sensor. The dependence of the Q factor on resonance frequency of the sensor and the long-range force between tip and sample were measured and analyzed in view of the various dissipation channels. Dissipation in the signal detection circuit turned out to be mainly limited by the total Q factor of the nc-AFM system.
Rights: (c) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License. The following article appeared in Hiroaki Ooe, Tatsuya Sakuishi, Makoto Nogami, Masahiko Tomitori and Toyoko Arai, Applied Physics Letters, 105(4), 043107 (2014) and may be found at http://dx.doi.org/10.1063/1.4891882
URI: http://hdl.handle.net/10119/12895
Material Type: publisher
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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