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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/14319

Title: 界面ポテンシャル逐次測定法の開発によるイオン拡散の可視化
Other Titles: Visualization of ion diffusion process at interface by sequential measurement method of electrostatic potential
Authors: 大島, 義文
Authors(alternative): Oshima, Yoshifumi
Keywords: 透過型電子顕微鏡
Issue Date: 2-Jun-2017
Abstract: 透過型電子顕微鏡 (TEM) 像に強度輸送方程式を適用することで、異相界面の静電ポテンシャル分布の可視化、および、それに基づいたイオン拡散の様子を明らかにする目的で研究を推進した。静電ポテンシャル分布を得るため、アンダーフォーカス、インフォーカス、オーバーフォーカスの3枚のTEM像から、a-Ge膜/真空界面における静電ポテンシャル分を得ることに成功した。これを実現するため、ホワイトノイズの低周波数成分が強調されるという課題の解決、および、2相界面のTEM像という周期的境界条件が満たされていない像に強度輸送方程式を適用するための課題を解決することを行った。:In order to clarify the visualization of the electrostatic potential distribution at the interfaces of two different phases and find the local ion diffusion at the interface, intensity transport equations was applied to the transmission electron microscope (TEM) images. We succeeded in obtaining the electrostatic potential at the a-Ge film / vacuum interface from the three TEM images of under focus, in focus and over focus. Actually, we solved the problem that the low frequency component of white noise is emphasized in the TIE phase map by narrower region of interest, and also solved the problem that the intensity transport equation could not be applied to the image not satisfying the periodic boundary condition such as TEM image of two phase interface by mirroring method.
Description: 挑戦的萌芽研究
Language: jpn
URI: http://hdl.handle.net/10119/14319
Appears in Collections:2016年度 (FY 2016)

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