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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/14322

Title: 走査型プローブ顕微鏡を応用した固体表面上1分子の電荷状態変化の測定
Other Titles: Measurements of the charge state of a molecule on a solid substrate on the basis of scanning probe microscopy
Authors: 富取, 正彦
Authors(alternative): Tomitori, Masahiko
Keywords: 走査プローブ顕微鏡
Issue Date: 2-Jun-2017
Abstract: 原子スケールで鋭利な探針を試料に接近させて表面の凹凸や物性を計測する走査型プローブ顕微鏡(SPM)は、ナノテクノロジー・科学技術の発展に大きく貢献してきた。SPMが持つ原子レベルの高分解能を活かしながら、表面電子状態を解析する手法としてSPMがさらに進化することが期待されている。本研究では、SPMの一つ、非接触原子間力顕微鏡(nc-AFM)に基づいた計測で、散逸エネルギーの感度を向上させ、またチャージアンプ(CA)を併用することで、信号の解析を進め、探針-試料間の相互作用力を起源とした現象、および、静電容量と接触電位差を起源とした物性を原子レベルの分解能で測定した。:Scanning probe microscopy (SPM) has successfully contributed to the evolution of nanotechnology and nanoscience, which provides us with surface topographic images, including nanoscale surface properties, of a great number of materials by approaching an atomically-sharpened tip to the sample surface. Nowadays, the further developments of SPM are intensively expected in regard to the nanoscale surface characterization. In this study, we improved the sensitivity of mechanical dissipation energy in a non-contact atomic force microscopy (nc-AFM) system, and installed a wide-band charge amplifier (CA) to the system, in order to extend the potential of the nanoscale characterization of nc-AFM. Atomic-scale capacitance and contact potential difference between the nc-AFM tip and a Si(111)-7×7 surface were analyzed, as a demonstration. CA maps exhibited atomic-scale contrast at a fast scanning rate, indicating the usefulness of our developed methods.
Description: 挑戦的萌芽研究
Language: jpn
URI: http://hdl.handle.net/10119/14322
Appears in Collections:2016年度 (FY 2016)

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