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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/15374

Title: Practical procedure for retrieval of quantitative phase map for two-phase interface using the transport of intensity equation
Authors: Zhang, Xiaobin
Oshima, Yoshifumi
Keywords: Transport of intensity equation
TEM
Phase map
Issue Date: 2015-07-04
Publisher: Elsevier
Magazine name: Ultramicroscopy
Volume: 158
Start page: 49
End page: 55
DOI: 10.1016/j.ultramic.2015.06.015
Abstract: A practical procedure for retrieving quantitative phase distribution at the interface between a thin amorphous germanium (a-Ge) film and vacuum based on the transport of intensity equation is proposed. First, small regions were selected in transmission electron microscopy (TEM) images with three different focus settings in order to avoid phase modulation due to low frequency noise. Second, the selected TEM image and its three reflected images were combined for mirror-symmetry to meet the boundary requirements. However, in this symmetrization, extra phase modulation arose due to the discontinuous nature of Fresnel fringes at the boundaries among the four parts of the combined image. Third, a corrected phase map was obtained by subtracting a linear fit to the extra phase modulation. The phase shift for a thin a-Ge film was determined to be approximately 0.5 rad, indicating that the average inner potential was 18.3 V. The validity of the present phase retrieval is discussed using simple simulations.
Rights: Copyright (C)2015, Elsevier. Licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International license (CC BY-NC-ND 4.0). [http://creativecommons.org/licenses/by-nc-nd/4.0/] NOTICE: This is the author's version of a work accepted for publication by Elsevier. Xiaobin Zhang, Yoshifumi Oshima, Ultramicroscopy, 158, 2015, 49-55, http://dx.doi.org/10.1016/j.ultramic.2015.06.015
URI: http://hdl.handle.net/10119/15374
Material Type: author
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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