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Please use this identifier to cite or link to this item: https://hdl.handle.net/10119/20090

Title: MoS2ナノリボンチャネルにおける電子線照射ゲート効果のその場TEM観察
Authors: 陳, 麗米
Authors(alternative): ちん, れいまい
Keywords: in-situ TEM
indirect electron beam gating
MoS2 based-device
dielectric charging
Schottky contact
Capillary effect
Issue Date: Sep-2025
Description: Supervisor: 大島 義文
先端科学技術研究科
博士
Title(English): In-situ TEM observation of electron irradiation gate effect in MoS2 nanoribbon channels
Authors(English): CHEN, LIMI
Language: eng
URI: https://hdl.handle.net/10119/20090
Academic Degrees and number: 甲第1587号
Degree-granting date: 2025-09-24
Degree name: 博士 (マテリアルサイエンス)
Degree-granting institutions: 北陸先端科学技術大学院大学
Appears in Collections:D-MS. 2025年度(R07) (Jun.2025 - Mar.2026)

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