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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/2770

Title: Kelvin法による電荷移動型薄膜の評価
Authors: 平林, 修
Authors(alternative): ひらばやし, おさむ
Keywords: ケルビンプローブ、電荷移動錯体、中性イオン性相転移
Kelvin Probe,Charge transfer complex,N-I phase tra
Issue Date: Mar-2001
Description: 
Supervisor:三谷 忠興
材料科学研究科
修士
Title(English): Charge transfer type thin film studied by Kelvin Probe
Authors(English): Hirabayasi, Osamu
Language: jpn
URI: http://hdl.handle.net/10119/2770
Appears in Collections:M-MS. 2000年度(H12) (Jun.2000 - Mar.2001)

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