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Master of Science（Materials Science） >
H16) (Jun.2004 - Mar.2005 >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/10119/3218
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| Title: | 走査型プローブ顕微鏡の開発と表面相互作用分光法への応用 |
| Authors: | 大久保, 芳彦 |
| Authors(alternative): | おおくぼ, よしひこ |
| Keywords: | 走査型トンネル顕微鏡、電圧印加非接触原子間力分光法
Scannning Tunneling Microscope, Noncontact Atomic |
| Issue Date: | Mar-2005 |
| Description: |
Supervisor:富取 正彦
材料科学研究科
修士 |
| Title(English): | The development of the scanning probe microscope and the application to the surface interaction spectroscopy |
| Authors(English): | Ohkubo, yoshihiko |
| URI: | http://hdl.handle.net/10119/3218 |
| Appears in Collections: | M-MS. 2004年度(H16) (Jun.2004 - Mar.2005)
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