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H17) (Jun.2005 - Mar.2006 >
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http://hdl.handle.net/10119/3228
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Title: | X線反射率測定によるポリヘキシルチオフェン超薄膜の構造評価 |
Authors: | 黒澤, 剛志 |
Authors(alternative): | くろさわ, つよし |
Keywords: | ポリヘキシルチオフェン,超薄膜, X線反射率 polyhexylthiophene, ultra-thin film, X-ray reflect |
Issue Date: | Mar-2006 |
Description: | Supervisor:佐々木 伸太郎教授 材料科学研究科 修士 |
Title(English): | Structural evaluation of polyhexylthiophene ultra-thin films by X-ray reflectivity measurements |
Authors(English): | Kurosawa, Tsuyoshi |
Language: | eng |
URI: | http://hdl.handle.net/10119/3228 |
Appears in Collections: | M-MS. 2005年度(H17) (Jun.2005 - Mar.2006)
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