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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/3228

Title: X線反射率測定によるポリヘキシルチオフェン超薄膜の構造評価
Authors: 黒澤, 剛志
Authors(alternative): くろさわ, つよし
Keywords: ポリヘキシルチオフェン,超薄膜, X線反射率
polyhexylthiophene, ultra-thin film, X-ray reflect
Issue Date: Mar-2006
Supervisor:佐々木 伸太郎教授
Title(English): Structural evaluation of polyhexylthiophene ultra-thin films by X-ray reflectivity measurements
Authors(English): Kurosawa, Tsuyoshi 
Language: eng
URI: http://hdl.handle.net/10119/3228
Appears in Collections:M-MS. 2005年度(H17) (Jun.2005 - Mar.2006)

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