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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/3385

Title: Images of cleaved GaAs(110) surfaces observed with a reflection optical second harmonic microscope
Authors: Sano, H
Shimizu, T
Mizutani, G
Ushioda, S
Issue Date: 2000-02
Magazine name: Journal of Applied Physics
Volume: 87
Number: 4
Start page: 1614
End page: 1619
DOI: 10.1063/1.372068
Abstract: We have developed a reflection optical second harmonic (SH) microscope as a new surface probe. Using the combination of the developed SH microscope, a near infrared microscope, a confocal laser microscope, a Raman microprobe spectrometer, and an electron probe microanalyzer for x-ray fluorescence, we have observed microstructures on cleaved GaAs (110) surface. We have demonstrated that slab structures on these surfaces are unambiguously identified by the analysis using a combination of these microscopes. We have found that the reflection SH microscope is especially sensitive to the slab structures. The enhancement of second harmonic generation by the slab structure could be well accounted for by an electromagnetic calculation of the SH intensity.
Rights: Copyright 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in H. Sano, T. Shimizu, G. Mizutani and S. Ushioda, Journal of Applied Physics 87(4), 1614-1619 (2000) and may be found at http://link.aip.org/link/?jap/87/1614.
URI: http://hdl.handle.net/10119/3385
Material Type: publisher
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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