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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/3994

Title: Field-effect modulation of contact resistance between carbon nanotubes
Authors: Kodama, Yoshihiro
Sato, Ryota
Inami, Nobuhito
Shikoh, Eiji
Yamamoto, Yoshiyuki
Hori, Hidenobu
Kataura, Hiromichi
Fujiwara, Akihiko
Issue Date: 2007-09
Publisher: AMERICAN INSTITUTE OF PHYSICS
Magazine name: Applied Physics Letters
Volume: 91
Number: 13
Start page: 133515-1
End page: 133515-3
DOI: 10.1063/1.2790805
Abstract: Local transport properties of a carbon nanotube (CNT) thin-film transistor (TFT) have been investigated by conducting atomic force microscopy. The current in a CNT bundle is almost constant, whereas it drastically decreases at the contacts between CNTs. Current drops at the contacts are reduced with increasing negative gate voltage V_G. The results show that the contact resistance between CNTs can be modified by V_G, and the operation of CNT-TFT is mainly governed by the modulation of contact resistance.
Rights: Copyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Y. Kodamaa, R. Sato, N. Inami, E. Shikoh, Y. Yamamoto, H. Hori, H. Kataura, A. Fujiwara, Applied Physics Letters 91(13), 133515 (2007) and may be found at http://link.aip.org/link/?apl/91/133515.
Type: Article
URI: http://hdl.handle.net/10119/3994
Material Type: publisher
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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