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このアイテムの引用には次の識別子を使用してください: http://hdl.handle.net/10119/4163

タイトル: Interplay between Nonlinearity , Scan Speed, Damping, and Electronics in Frequency Modulation Atomic-Force Microscopy
著者: Gauthie, Michel
Perez, Ruben
Arai, Toyoko
Tomitori, Masahiko.
Tsukada, Masaru
発行日: 2002-09-16
誌名: Physical Review Letters
巻: 89
号: 14
開始ページ: 146104-1
終了ページ: 146104-4
DOI: 10.1103/PhysRevLett.89.146104
抄録: Numerical simulations of the frequency modulation atomic force microscope, including the whole dynamical regulation by the electronics, show that the cantilever dynamics is conditionally stable and that there is a direct link between the frequency shift and the conservative tip-sample interaction. However, a soft coupling between the electronics and the nonlinearity of the interaction may significantly affect the damping. A resonance between the scan speed and the response time of the system can provide a simple explanation for the spatial shift and contrast inversion between topographical and damping images, and for the extreme sensitivity of the damping to a tip change
Rights: Michel Gauthier, Ruben Perez, Toyoko Arai, Masahiko Tomitori, and Masaru Tsukada , Physical Review Letters, 89(14), 146104, 2002. Copyright 2002 by the American Physical Society. http://link.aps.org/doi/10.1103/PhysRevLett.89.146104
URI: http://hdl.handle.net/10119/4163
資料タイプ: publisher
出現コレクション:c10-1. 雑誌掲載論文 (Journal Articles)


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