JAIST Repository >
School of Materials Science >
Articles >
Journal Articles >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/4163

Title: Interplay between Nonlinearity , Scan Speed, Damping, and Electronics in Frequency Modulation Atomic-Force Microscopy
Authors: Gauthie, Michel
Perez, Ruben
Arai, Toyoko
Tomitori, Masahiko.
Tsukada, Masaru
Issue Date: 2002-09-16
Magazine name: Physical Review Letters
Volume: 89
Number: 14
Start page: 146104-1
End page: 146104-4
DOI: 10.1103/PhysRevLett.89.146104
Abstract: Numerical simulations of the frequency modulation atomic force microscope, including the whole dynamical regulation by the electronics, show that the cantilever dynamics is conditionally stable and that there is a direct link between the frequency shift and the conservative tip-sample interaction. However, a soft coupling between the electronics and the nonlinearity of the interaction may significantly affect the damping. A resonance between the scan speed and the response time of the system can provide a simple explanation for the spatial shift and contrast inversion between topographical and damping images, and for the extreme sensitivity of the damping to a tip change
Rights: Michel Gauthier, Ruben Perez, Toyoko Arai, Masahiko Tomitori, and Masaru Tsukada , Physical Review Letters, 89(14), 146104, 2002. Copyright 2002 by the American Physical Society. http://link.aps.org/doi/10.1103/PhysRevLett.89.146104
URI: http://hdl.handle.net/10119/4163
Material Type: publisher
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

Files in This Item:

File Description SizeFormat
117-26.pdf268KbAdobe PDFView/Open

All items in DSpace are protected by copyright, with all rights reserved.


Contact : Library Information Section, Japan Advanced Institute of Science and Technology