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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/4499

Title: Azimuthal angle dependence of optical second harmonic intensity from a vicinal GaAs(001) wafer
Authors: Takebayashi, Motonari
Mizutani, Goro
Ushioda, Sukekatsu
Keywords: optical second harmonic generation
vicinal GaAs(001)
tilt angle
surface nonlinearity
Issue Date: 1997-01-01
Publisher: Elsevier
Magazine name: Optics Communications
Volume: 133
Number: 1-6
Start page: 116
End page: 122
DOI: 10.1016/S0030-4018(96)00491-9
Abstract: We demonstrate that the tilt angle of a zinc blende type single crystal (001) wafer can be measured by optical second harmonic generation. The SH intensity patterns were analyzed for all four combinations of p- and s-polarized incidence and output, considering both the bulk and surface optical nonlinearities in the electric dipole approximation. We found that the measurement using s-incident polarization is particularly useful in determining the tilt angle of the crystal axes. The parameters determined by the present method agree well with those obtained by X-ray diffraction measurements. The [110] and [110] directions can be distinguished through the analysis of the p-incident and p-output SH intensity patterns.
Rights: NOTICE: This is the author's version of a work accepted for publication by Elsevier. M. Takebayashi, G. Mizutani, and S. Ushioda, Optics Communications, 133(1-6), 1997, 116-122, http://dx.doi.org/10.1016/S0030-4018(96)00491-9
URI: http://hdl.handle.net/10119/4499
Material Type: author
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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