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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/7866

Title: C_<70> close-packed surfaces and single molecule void-formation by local electric field through a scanning tunneling microscope tip
Authors: Ohta, Yohei
Mitsuhashi, Ryoji
Nouchi, Ryo
Fujiwara, Akihiko
Hino, Shojun
Kubozono, Yoshihiro
Issue Date: 2009-01-27
Publisher: American Institute of Physics
Magazine name: Applied Physics Letters
Volume: 94
Number: 4
Start page: 043107-1
End page: 043107-3
DOI: 10.1063/1.3075959
Abstract: A C_<70> close-packed surface was formed by a heating of the Si surface, which is covered with C_<70> molecules. The close-packed surface is assigned to high-temperature hexagonal close-packed phase. The stability of C_<70> close-packed surface and formation of nanometer scale structures are studied by the application of local electric field to the close-packed surface. An application of local electric field from scanning tunneling microscope tip to the C_<70> close-packed surface caused molecular scale evaporation. The application of local electric field near strain in the surface produced a very large void by an evaporation of more than 20 of C_<70> molecules.
Rights: Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Yohei Ohta, Ryoji Mitsuhashi, Ryo Nouchi, Akihiko Fujiwara, Shojun Hino, and Yoshihiro Kubozono, Applied Physics Letters, 94, 043107 (2009) and may be found at http://link.aip.org/link/?APPLAB/94/043107/1
URI: http://hdl.handle.net/10119/7866
Material Type: publisher
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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