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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/7939

Title: 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用
Authors: 富取, 正彦
新井, 豊子
Keywords: noncontact atomic force microscopy
noncontact atomic force spectroscopy
covalent bonding
bias voltage
Issue Date: 2008
Publisher: 日本表面科学会
Magazine name: 表面科学
Volume: 29
Number: 4
Start page: 239
End page: 245
Abstract: A novel surface spectroscopic method referred to itself as noncontact atomic force spectroscopy (nc-AFS) is presented, which is based on noncontact atomic force microscopy (nc-AFM) and scanning tunneling spectroscopy (STS) of the family of scanning probe microscopy (SPM). The interaction force and current are measured with sweeping bias voltage between a tip and a sample at a close tip-sample separation, and analyzed in terms of surface spectroscopy. The spectra obtained by the nc-AFS indicate that the resonance states, i. e., covalent bonding, between a Si tip and a Si sample can be formed by tuning the bias voltage, corresponding to the relative shift of energy levels of tip states and sample states. Moreover, the nc-AFS combined with current measurement exhibits potential of evaluating the collapse of tunneling barrier and analyzing the correlation between force interaction and electron conductance between two pieces of condensed matter in proximity.
Rights: Copyright (C) 2008 日本表面科学会. 富取正彦、新井豊子, 表面科学, 29(4), 2008, 239-245.
URI: http://hdl.handle.net/10119/7939
Material Type: publisher
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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