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このアイテムの引用には次の識別子を使用してください: http://hdl.handle.net/10119/8788

タイトル: Evaluating Origin of Electron Traps in Tris(8-hydroxyquinoline) Aluminum Thin Films using Thermally Stimulated Current Technique
著者: Matsushima, Toshinori
Adachi, Chihaya
キーワード: tris(8-hydroxyquinoline) aluminum
electron trap
electron transport
thermally stimulated current
oxygen
発行日: 2008
出版者: The Japan Society of Applied Physics
誌名: Japanese Journal of Applied Physics
巻: 47
号: 3
開始ページ: 1748
終了ページ: 1752
DOI: 10.1143/JJAP.47.1748
抄録: We measured the energy distributions and concentrations of electron traps in O_2-unexposed and O_2-exposed tris(8-hydroxyquinoline) aluminum (Alq_3) films using a thermally stimulated current (TSC) technique to investigate how doping O_2 molecules in Alq_3 films affect the films' electron trap and electron transport characteristics. The results of our TSC studies revealed that Alq_3 films have an electron trap distribution with peak depths ranging from 0.075 to 0.1 eV and peak widths ranging from 0.06 and 0.07 eV. Exposing the Alq_3 films to O_2 atmosphere induced a marked increase in electron trap concentration, indicating that electron traps with an energy distribution originate from O_2 molecules absorbed in Alq_3 films. We measured the current density-voltage characteristics of these films. The driving and turn-on voltages of the O_2-exposed Alq_3 film became higher than those of the O_2-unexposed Alq_3 film owing to the increase in electron trap concentration caused by the O_2 doping of the Alq_3 films.
Rights: This is the author's version of the work. It is posted here by permission of The Japan Society of Applied Physics. Copyright (C) 2008 The Japan Society of Applied Physics. Toshinori Matsushima and Chihaya Adachi, Japanese Journal of Applied Physics, 47(3), 2008, 1748-1752. http://jjap.ipap.jp/link?JJAP/47/1748/
URI: http://hdl.handle.net/10119/8788
資料タイプ: author
出現コレクション:c10-1. 雑誌掲載論文 (Journal Articles)

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