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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/8788

Title: Evaluating Origin of Electron Traps in Tris(8-hydroxyquinoline) Aluminum Thin Films using Thermally Stimulated Current Technique
Authors: Matsushima, Toshinori
Adachi, Chihaya
Keywords: tris(8-hydroxyquinoline) aluminum
electron trap
electron transport
thermally stimulated current
Issue Date: 2008
Publisher: The Japan Society of Applied Physics
Magazine name: Japanese Journal of Applied Physics
Volume: 47
Number: 3
Start page: 1748
End page: 1752
DOI: 10.1143/JJAP.47.1748
Abstract: We measured the energy distributions and concentrations of electron traps in O_2-unexposed and O_2-exposed tris(8-hydroxyquinoline) aluminum (Alq_3) films using a thermally stimulated current (TSC) technique to investigate how doping O_2 molecules in Alq_3 films affect the films' electron trap and electron transport characteristics. The results of our TSC studies revealed that Alq_3 films have an electron trap distribution with peak depths ranging from 0.075 to 0.1 eV and peak widths ranging from 0.06 and 0.07 eV. Exposing the Alq_3 films to O_2 atmosphere induced a marked increase in electron trap concentration, indicating that electron traps with an energy distribution originate from O_2 molecules absorbed in Alq_3 films. We measured the current density-voltage characteristics of these films. The driving and turn-on voltages of the O_2-exposed Alq_3 film became higher than those of the O_2-unexposed Alq_3 film owing to the increase in electron trap concentration caused by the O_2 doping of the Alq_3 films.
Rights: This is the author's version of the work. It is posted here by permission of The Japan Society of Applied Physics. Copyright (C) 2008 The Japan Society of Applied Physics. Toshinori Matsushima and Chihaya Adachi, Japanese Journal of Applied Physics, 47(3), 2008, 1748-1752. http://jjap.ipap.jp/link?JJAP/47/1748/
URI: http://hdl.handle.net/10119/8788
Material Type: author
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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