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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/9071

Title: Frequency modulation atomic force microscope observation of TiO_2(110) surfaces in water
Authors: Sasahara, Akira
Tomitori, Masahiko
Keywords: atomic force microscopy
titanium dioxide
water
Issue Date: 2010-05-28
Publisher: American Vacuum Society
Magazine name: Journals of Vacuum Science and Technology B
Volume: 28
Number: 3
Start page: C4C5
End page: C4C10
DOI: 10.1116/1.3294707
Abstract: Rutile titanium dioxide (TiO_2) (110) surfaces were examined in water using a frequency modulation atomic force microscope. On the surfaces cleaned by Ar^+ sputtering and annealing in ultrahigh vacuum, step-terrace structure was observed. The inlets at the steps and the pits on the terraces indicated erosion of the surface in water. Strings extended to the [001] direction were occasionally observed in the topography images and assigned to the clusters of the H_2O molecules. The tip experienced a repulsive force when the vertical tip position of z was less than 6 nm from the surface, and the force oscillated at z at less than 2 nm. The repulsive force originated from the disruption of the hydrogen bonding network of H_2O molecules formed on the hydrophilic sputter-annealed surface. The oscillatory force arose from structural alternate order-disorder transitions of the H_2O molecules at the gap between the tip and the TiO_2 surfaces. On the TiO_2 surface annealed in air, no strings were observed in the topography images. The tip experienced an attractive force before experiencing a repulsive force in its approach to the surface. Oscillatory behavior was not observed in the force curve. The air-annealed TiO_2 and tip surfaces were both hydrophobic and attracted to each other to expel the H_2O molecules from their gap. Ordering the H_2O molecules at the gap between the two hydrophobic surfaces was entropically unfavorable.
Rights: Copyright 2010 American Vacuum Society. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Vacuum Society. The following article appeared in Akira Sasahara and Masahiko Tomitori, Journals of Vacuum Science and Technology B, 28(3), C4C5-C4C10 (2010) and may be found at http://dx.doi.org/10.1116/1.3294707
URI: http://hdl.handle.net/10119/9071
Material Type: publisher
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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