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Master of Science（Materials Science） >
H22) (Jun.2010 - Mar.2011 >
Please use this identifier to cite or link to this item:
https://hdl.handle.net/10119/9138
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| Title: | Carrier injection mechanism at the metal-semiconductor interface in CNT-FETs |
| Authors: | SHIH, Hong-An |
| Authors(alternative): | しい, ほんあん |
| Keywords: | CNT-FET
thermionic emission
thermionic field emission
tunneling |
| Issue Date: | Sep-2010 |
| Description: | Assoc. Prof. Toshi-kazu SUZUKI
マテリアルサイエンス研究科
修士 |
| Title(English): | Carrier injection mechanism at the metal-semiconductor interface in CNT-FETs |
| Authors(English): | SHIH, Hong-An |
| Language: | eng |
| URI: | https://hdl.handle.net/10119/9138 |
| Appears in Collections: | M-MS. 2010年度(H22) (Jun.2010 - Mar.2011)
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Files in This Item:
| File |
Description |
Size | Format |
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| abstract.pdf | | 146Kb | Adobe PDF | View/Open |
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