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富取 正彦(トミトリ マサヒコ)教授研究者総覧

1 Energy dissipation unveils atomic displacement in the noncontact atomic force microscopy imaging of Si(111)-(7×7) / Arai, Toyoko, Inamura, Ryo, Kura, Daiki, Tomitori, Masahiko, Physical Review B, 97, pp.115428-1-115428-6, 2018-03-19, American Physical Society
2 Quasi-stabilized hydration layers on muscovite mica under a thin water film grown from humid air / Arai, Toyoko, Sato, Kohei, Iida, Asuka, Tomitori, Masahiko, Scientific Reports, 7, pp.Article number: 4054-, 2017-06-22, Springer Nature
3 走査型プローブ顕微鏡を応用した固体表面上1分子の電荷状態変化の測定 / 富取, 正彦, 科学研究費助成事業研究成果報告書, pp.1-5, 2017-06-02
4 走査型プローブ顕微鏡技術を利用したナノ接合界面の形成と解析 / 富取, 正彦, 科学研究費助成事業研究成果報告書, pp.1-6, 2016-06-03
5 Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy / Ooe, Hiroaki, Sakuishi, Tatsuya, Nogami, Makoto, Tomitori, Masahiko, Arai, Toyoko, Applied Physics Letters, 105(4), pp.043107-1-043107-4, 2014-07-30, American Institute of Physics
6 Stable alignment of 4,4″-diamino-p-terphenyl chemically adsorbed on a Si(001)-(2 × 1) surface observed by scanning tunneling microscopy / Amer Hassan, Amer Mahmoud, Nishimura, Takashi, Sasahara, Akira, Murata, Hideyuki, Tomitori, Masahiko, Surface Science, 630, pp.96-100, 2014-07-23, Elsevier
7 Electrochemical etching of metal wires in low-stress electric contact using a liquid metal electrode to fabricate tips for scanning tunneling microscopy / Nishimura, Takashi, Amer Hassan, Amer Mahmoud, Tomitori, Masahiko, Applied Surface Science, 284, pp.715-719, 2013-08-13, Elsevier
8 複合顕微鏡による高温下でのナノ接点・接合形成のその場観察・解析 / 富取, 正彦, 科学研究費助成事業研究成果報告書, pp.1-5, 2013-06-03
9 電圧印加非接触原子間力顕微鏡/分光法による固体表面間の結合形成過程の解析 / 富取, 正彦, 科学研究費補助金研究成果報告書, pp.1-6, 2012-06-04
10 Frequency modulation atomic force microscope observation of TiO_2(110) surfaces in water / Sasahara, Akira, Tomitori, Masahiko, Journals of Vacuum Science and Technology B, 28(3), pp.C4C5-C4C10, 2010-05-28, American Vacuum Society
11 Low-flux elucidation of initial growth of Ge clusters deposited on Si(111)-7×7 observed by scanning tunneling microscopy / Ansari, Z. A., Arai, T., Tomitori, M., Physical Review B, 79(3), pp.033302-1-033302-4, 2009, American Physical Society
12 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用 / 富取, 正彦, 新井, 豊子, 表面科学, 29(4), pp.239-245, 2008, 日本表面科学会
13 Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x7 / Ansari, Zubaida A., Tomitori, Masahiko, Arai, Toyoko, Applied Physics Letters, 88(17), pp.171902-1-171902-3, 2006-04-25, American Institute of Physics
14 Electric conductance through chemical bonding states being formed between a Si tip and a Si(111)-(7x7) surface by bias-voltage noncontact atomic force spectroscopy / Arai, T., Tomitori, M., Physical Review B, 73(7), pp.073307-1-073307-4, 2006-02-13, American Physical Society
15 A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe / Arai, Toyoko, Tomitori, Masahiko, Applied Physics Letters, 86(7), pp.073110-1-073110-3, 2005-02-08, American Institute of Physics
16 Observation of Electronic States on Si(111)-(7x7) through Short-Range Attractive Force with Noncontact Atomic Force Spectroscopy / Arai, T., Tomitori, M., Physical Review Letters, 93(25), pp.256101-1-256101-4, 2004-12-17, AMERICAN PHYSICAL SOCIETY
17 Germanium nanostructures on silicon observed by scanning probe microscopy / Tomitori, Masahiko, Arai, Toyoko, MRS Bulletin, 29(7), pp.484-487, 2004-07, Materials Research Society
18 Interplay between Nonlinearity , Scan Speed, Damping, and Electronics in Frequency Modulation Atomic-Force Microscopy / Gauthie, Michel, Perez, Ruben, Arai, Toyoko, Tomitori, Masahiko., Tsukada, Masaru, Physical Review Letters, 89(14), pp.146104-1-146104-4, 2002-09-16, AMERICAN PHYSICAL SOCIETY
19 超高真空STMで安定な原子像を得るためには?-試作と実験のノウハウ (I)- / 富取, 正彦, 表面科学, 17(5), pp.286-289, 1996-05, 日本表面科学会
20 超高真空STMで安定な原子像を得るためには?-試作と実験のノウハウ (II)- / 富取, 正彦, 表面科学, 17(6), pp.352-355, 1996, 日本表面科学会


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