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Title: | Core level excitations - a fingerprint of structural and electronic properties of epitaxial silicene |
Authors: | Friedlein, R. Fleurence, A. Aoyagi, K. Jong, M. P. de Bui, H. Van Wiggers, F. B. Yoshimoto, S. Koitaya, T. Shimizu, S. H. Noritake Mukai, K. Yoshinobu, J. Yamada-Takamura, Y. |
Keywords: | silicene core level photoelectron spectroscopy NEXAFS |
Issue Date: | 2014-05-12 |
Publisher: | American Institute of Physics |
Magazine name: | Journal of Chemical Physics |
Volume: | 140 |
Number: | 18 |
Start page: | 184704-1 |
End page: | 184704-6 |
DOI: | 10.1063/1.4875075 |
Abstract: | From the analysis of high-resolution Si 2p photoelectron and near-edge x-ray absorption fine structure(NEXAFS) spectra, we show that core level excitations of epitaxial silicene on ZrB_2(0001) thin films are characteristically different from those of sp^3-hybridized silicon. In particular, it is revealed that the lower Si 2p binding energies and the low onset in the NEXAFS spectra as well as the occurrence of satellite features in the core level spectra are attributed to the screening by low-energy valence electrons and interband transitions between π bands, respectively. The analysis of observed Si 2p intensities related to chemically distinct Si atoms indicates the presence of at least one previously unidentified component. The presence of this component suggests that the observation of stress-related stripe domains in scanning tunnelling microscopy images is intrinsically linked to the relaxation of Si atoms away from energetically unfavourable positions. |
Rights: | Copyright 2014 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in R. Friedlein, A. Fleurence, K. Aoyagi, M. P. de Jong, H. Van Bui, F. B. Wiggers, S. Yoshimoto, T. Koitaya, S. Shimizu, H. Noritake, K. Mukai, J. Yoshinobu, and Y. Yamada-Takamura, Journal of Chemical Physics, 140(18), 184704 (2014) and may be found at http://dx.doi.org/10.1063/1.4875075 |
URI: | http://hdl.handle.net/10119/12320 |
Material Type: | publisher |
Appears in Collections: | c10-1. 雑誌掲載論文 (Journal Articles)
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