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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/14267

Title: Controllable Threshold Voltage in Organic Complementary Logic Circuits with an Electron-Trapping Polymer and Photoactive Gate Dielectric Layer
Authors: Dao, Toan Thanh
Sakai, Heisuke
Nguyen, Hai Thanh
Ohkubo, Kei
Fukuzumi, Shunichi
Murata, Hideyuki
Keywords: low program voltage
controllable threshold voltage
organic complementary circuit
CMOS
long retention time
Issue Date: 2016-06-27
Publisher: American Chemical Society
Magazine name: ACS Applied Materials & Interfaces
Volume: 8
Number: 28
Start page: 18249
End page: 18255
DOI: 10.1021/acsami.6b03183
Abstract: We present controllable, highly stable complementary organic transistor circuits on a PET substrate, using a photoactive dielectric layer of 6-[4'-(N,N-diphenylamino)phenyl]-3- ethoxycarbonylcoumarin (DPA-CM) doped into poly(methyl methacrylate) (PMMA) and an an electron-trapping layer of poly(perfluoroalkenyl vinyl ether) (Cytop). Cu was used for a source/drain electrode in both the p-channel and the n-channel transistors. The threshold voltage of the transistors and the inverting voltage of the circuits were reversibly controlled over a wide range under a program voltage of less than 10 V and under UV light irradiation. At a program voltage of −2 V, the inverting voltage of the circuits was tuned to be at nearly half of the supply voltage of the circuit. Consequently, an excellent balance between the high and low noise margins (NM) was produced (64% of NM_H and 68% of NM_L), resulting in the maximum noise immunity. Furthermore, the programmed circuits showed high stability such as a retention time over 10^5 s for the inverter switching voltage.
Rights: Toan Thanh Dao, Heisuke Sakai, Hai Thanh Nguyen, Kei Ohkubo, Shunichi Fukuzumi, and Hideyuki Murata, ACS Applied Materials & Interfaces, 2016, 8(28), pp.18249-18255. This document is the unedited author's version of a Submitted Work that was subsequently accepted for publication in ACS Applied Materials & Interfaces, copyright (c) American Chemical Society after peer review. To access the final edited and published work, see http://dx.doi.org/10.1021/acsami.6b03183
URI: http://hdl.handle.net/10119/14267
Material Type: author
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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