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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/18872

Title: Carrier lifetime measurement of perovskite films by differential microwave photoconductivity decay
Authors: Ohdaira, Keisuke
Huynh, Thi Cam Tu
Shimazaki, Ai
Kaneko, Ryuji
Sumai, Yuka
Shahiduzzaman, Md.
Taima, Tetsuya
Wakamiya, Atsushi
Issue Date: 2022-05-19
Publisher: IOP Publishing on behalf of the Japan Society of Applied Physics (JSAP)
Magazine name: Japanese Journal of Applied Physics
Volume: 61
Number: 6
Start page: 68001
DOI: 10.35848/1347-4065/ac5d22
Abstract: We measure the minority carrier lifetime of perovskite films by differential microwave photoconductivity decay (μ-PCD). Clear decay curves can be detected from bare and laminated methylammonium lead iodide (MAPbI3) films by the differential μ-PCD. The degradation of the bare and laminated MAPbI3 films under air exposure at room temperature is clearly observed as the continuous change of the decay curves. The differential μ-PCD can thus be a quick and non-destructive method for the characterization of the electrical quality of perovskite films and modules.
Rights: This is the author's version of the work. It is posted here by permission of The Japan Society of Applied Physics. Copyright (c) 2022 The Japan Society of Applied Physics. Keisuke Ohdaira, Huynh Thi Cam Tu, Ai Shimazaki, Ryuji Kaneko, Yuka Sumai, Md. Shahiduzzaman, Tetsuya Taima, and Atsushi Wakamiya, Japanese Journal of Applied Physics, 61 (6), 2022, 068001. https://doi.org/10.35848/1347-4065/ac5d22
URI: http://hdl.handle.net/10119/18872
Material Type: author
Appears in Collections:c10-1. 雑誌掲載論文 (Journal Articles)

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