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このアイテムの引用には次の識別子を使用してください:
http://hdl.handle.net/10119/18872
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| タイトル: | Carrier lifetime measurement of perovskite films by differential microwave photoconductivity decay |
| 著者: | Ohdaira, Keisuke
Huynh, Thi Cam Tu
Shimazaki, Ai
Kaneko, Ryuji
Sumai, Yuka
Shahiduzzaman, Md.
Taima, Tetsuya
Wakamiya, Atsushi |
| 発行日: | 2022-05-19 |
| 出版者: | IOP Publishing on behalf of the Japan Society of Applied Physics (JSAP) |
| 誌名: | Japanese Journal of Applied Physics |
| 巻: | 61 |
| 号: | 6 |
| 開始ページ: | 68001 |
| DOI: | 10.35848/1347-4065/ac5d22 |
| 抄録: | We measure the minority carrier lifetime of perovskite films by differential microwave photoconductivity decay (μ-PCD). Clear decay curves can be detected from bare and laminated methylammonium lead iodide (MAPbI3) films by the differential μ-PCD. The degradation of the bare and laminated MAPbI3 films under air exposure at room temperature is clearly observed as the continuous change of the decay curves. The differential μ-PCD can thus be a quick and non-destructive method for the characterization of the electrical quality of perovskite films and modules. |
| Rights: | This is the author's version of the work. It is posted here by permission of The Japan Society of Applied Physics. Copyright (c) 2022 The Japan Society of Applied Physics. Keisuke Ohdaira, Huynh Thi Cam Tu, Ai Shimazaki, Ryuji Kaneko, Yuka Sumai, Md. Shahiduzzaman, Tetsuya Taima, and Atsushi Wakamiya, Japanese Journal of Applied Physics, 61 (6), 2022, 068001. https://doi.org/10.35848/1347-4065/ac5d22 |
| URI: | http://hdl.handle.net/10119/18872 |
| 資料タイプ: | author |
| 出現コレクション: | c10-1. 雑誌掲載論文 (Journal Articles)
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