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このアイテムの引用には次の識別子を使用してください:
https://hdl.handle.net/10119/20314
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| タイトル: | Goal-Oriented Wireless Sensor Networks: Error Exponent and Outage Analyses with Distributed Hypothesis Testing |
| 著者: | Khaledian, Fatemeh
Asvadi, Reza
Adamou, Ismaila Salihou
Lin, Wensheng
Matsumoto, Tad |
| キーワード: | Distributed hypothesis testing (DHT)
error exponent
decision threshold
sufficient number of samples
Type-II error approximation
admissible rate-threshold region
outage probability
wireless sensor networks (WSNs) |
| 発行日: | 2026-03-04 |
| 出版者: | Institute of Electrical and Electronics Engineers (IEEE) |
| 誌名: | IEEE Sensors Journal |
| 開始ページ: | 1 |
| 終了ページ: | 1 |
| DOI: | 10.1109/JSEN.2026.3668389 |
| 抄録: | This paper presents an analytical framework for characterizing and evaluating the rate-threshold (RT) region in distributed hypothesis testing (DHT) against independence, assuming a binary symmetric source (BSS) model. We consider a single sensor–single decision center (DC) setting, where a lossy source encoder (SE) compresses its observations using a binary linear block code and transmits them over a fading wireless channel. The DC, in turn, has perfect side information via an ideal (error-free, non-fading) channel and performs hypothesis testing using the Neyman–Pearson criterion, as shown in the graphical example. In a finite-length regime, we derived lower and upper bounds on the Type-II error probability and determined the sufficient number of samples (SNS) and the corresponding decision threshold, for which the bounds are tight and yield an exponential approximation to the Type-II error probability under an ideal channel. Next, we define the admissible RT region by considering the critical relationship between the source coding rate and the decision threshold, an essential factor that influences the achievable Type-II error exponent. The impact of channel fading is then analyzed through the lens of the lossy source–channel separation theorem, leading to an outage probability expression. Numerical results are provided under the Nakagami fading model, illustrating how the outage probability is affected by the fading severity, decision threshold, and the correlation level between the source and side information. |
| Rights: | This is the author's version of the work. Copyright (C) 2026 IEEE. IEEE Sensors Journal (Early Access). DOI: https://doi.org/10.1109/JSEN.2026.3668389. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
| URI: | https://hdl.handle.net/10119/20314 |
| 資料タイプ: | author |
| 出現コレクション: | b10-1. 雑誌掲載論文 (Journal Articles)
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