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b10-1. 雑誌掲載論文 >
このアイテムの引用には次の識別子を使用してください:
http://hdl.handle.net/10119/4700
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| タイトル: | A Low Power Deterministic Test Using Scan Chain Disable Technique |
| 著者: | YOU, Zhiqiang
IWAGAKI, Tsuyoshi
INOUE, Michiko
FUJIWARA, Hideo |
| キーワード: | low power testing
full scan testing
deterministic test
scan chain disable
tabu search algorithm |
| 発行日: | 2006-06-01 |
| 出版者: | 電子情報通信学会 |
| 誌名: | IEICE TRANSACTIONS on Information and Systems |
| 巻: | E89-D |
| 号: | 6 |
| 開始ページ: | 1931 |
| 終了ページ: | 1939 |
| DOI: | 10.1093/ietisy/e89-d.6.1931 |
| 抄録: | This paper proposes a low power scan test scheme and formulates a problem based on this scheme. In this scheme the flip-flops are grouped into N scan chains. At any time, only one scan chain is active during scan test. Therefore, both average power and peak power are reduced compared with conventional full scan test methodology. This paper also proposes a tabu search-based approach to minimize test application time. In this approach we handle the information during deterministic test efficiently. Experimental results demonstrate that this approach drastically reduces both average power and peak power dissipation at a little longer test application time on various benchmark circuits. |
| Rights: | Copyright (C)2006 IEICE. Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue and Hideo Fujiwara, IEICE TRANSACTIONS on Information and Systems, E89-D(6), 2006, 1931-1939. http://www.ieice.org/jpn/trans_online/ |
| URI: | http://hdl.handle.net/10119/4700 |
| 資料タイプ: | publisher |
| 出現コレクション: | b10-1. 雑誌掲載論文 (Journal Articles)
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このアイテムのファイル:
| ファイル |
記述 |
サイズ | 形式 |
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| 6478.pdf | | 639Kb | Adobe PDF | 見る/開く |
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