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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/4785

Title: On accrual failure detectors
Authors: Defago, Xavier
Urban, Peter
Hayashibara, Naohiro
Katayama, Takuya
Issue Date: 2004-05-14
Publisher: 北陸先端科学技術大学院大学情報科学研究科
Magazine name: Research report (School of Information Science, Japan Advanced Institute of Science and Technology)
Volume: IS-RR-2004-011
Start page: 1
End page: 14
Abstract: Traditionally, failure detectors have considered a binary model whereby a given process can be either trusted or suspected. This paper defines a family of failure detectors, called accrual failure detectors, that revisits this interaction model. Accrual failure detectors associate to each process a real value representing a suspicion level. An important advantage of accrual failure detectors over binary ones is to allow distributed applications to trigger different actions depending on the suspicion level. For instance, an application can take precautionary measures when the suspicion level reaches a given level, and then take more drastic actions after it raises above a second (much higher) level. The paper defines accrual failure detectors and their basic properties. Four classes of accrual failure detectors are discussed, each of which is proved equivalent to a class of binary unreliable failure detectors (P, S, ◇P, and ◇S)
URI: http://hdl.handle.net/10119/4785
Material Type: publisher
Appears in Collections:IS-RR-2004

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