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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/4973

Title: Modeling of high-speed, large-signal transistor switching transients from s-parameter measurements
Authors: Ikawa, Yasuo
Eisenstadt, William R.
Dutton, Robert W.
Issue Date: 1981
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Magazine name: 1981 International Electron Devices Meeting
Volume: 27
Start page: 608
End page: 611
Abstract: A new technique has been developed to derive the large-signal transient response of semiconductor devices from small-signal frequency response data. The large-signal switching response can be calculated for an arbitrary input signal voltage and risetime. This new technique utilizes the Fourier transformation to combine arrays of small-signal data to compute the response waveform. The input waveform is decomposed into a superposition of small pulses. The response to each pulse is obtained by Fourier transformation techniques, using s-parameter data at appropriate bias points. The sum of these responses approximates the overall transient response. Simulations were performed for a GaAs MESFET for step inputs with the risetimes of 8 nsec and 150 psec. Good agreement was obtained between simulated waveforms and measured output waveforms in risetime, magnitude and waveform shape. This algorithm is general and will work for other measured small-signal transfer parameters as a function of frequency and bias.
Rights: Copyright (C)1981 IEEE. Reprinted from 1981 International Electron Devices Meeting, 27, 1981, 608-611. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of JAIST's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
URI: http://hdl.handle.net/10119/4973
Material Type: publisher
Appears in Collections:a11-1. 会議発表論文 (Conference Papers)

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