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Please use this identifier to cite or link to this item: http://hdl.handle.net/10119/9585

Title: A linguistic screening evaluation model in new product development
Authors: Huynh, Van-Nam
Nakamori, Yoshiteru
Keywords: New-product development
New-product go/stop evaluation
Linguistic multi-criteria decision making
Computing with words
Fuzzy set-based computation
Issue Date: 2011
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Magazine name: IEEE Transactions on Engineering Management
Volume: 58
Number: 1
Start page: 165
End page: 175
DOI: 10.1109/TEM.2009.2028326
Abstract: The screening of new product ideas is critically very important in new product development (NPD). Due to the incompleteness of information available and the qualitative nature of most evaluation criteria regarding NPD process, a fuzzy linguistic approach may be necessary for new-product screening, making use of linguistic assessments and the fuzzy-set-based computation. However, an inherent limitation of such a fuzzy linguistic approach is the loss of information caused by approximation processes, which eventually implies a lack of precision in the final results. This limitation even becomes more critical when applying the approach to new product screening. This paper proposes an approach to new product go/stop evaluation at the front end in NPD, based on the 2-tuple linguistic representation and the so-called preference-preserving transformation. It is shown that the proposed approach always yields a consistent result, while maintaining the flexibility for managers in making their decisions as in the fuzzy-set-based approach. Ultimately, this approach enhances the fuzzy-logic-based screening model proposed in the previous studies by overcoming the mentioned limitation. A case study taken from the literature is used to illuminate the proposed technique and to compare with the previous technique based on fuzzy computation.
Rights: Copyright (C) 2011 IEEE. Reprinted from IEEE Transactions on Engineering Management, 58(1), 2011, 165-175. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of JAIST's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
URI: http://hdl.handle.net/10119/9585
Material Type: publisher
Appears in Collections:a10-1. 雑誌掲載論文 (Journal Articles)

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