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このアイテムの引用には次の識別子を使用してください:
http://hdl.handle.net/10119/12844
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| タイトル: | Diagnosis of Stochastic Discrete Event Systems Based on N-gram Models |
| 著者: | Yoshimoto, Miwa
Kobayashi, Koichi
Hiraishi, Kunihiko |
| キーワード: | stochastic discrete event systems
diagnosis
N-gram models |
| 発行日: | 2015-02-01 |
| 出版者: | 電子情報通信学会 |
| 誌名: | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
| 巻: | E98-A |
| 号: | 2 |
| 開始ページ: | 618 |
| 終了ページ: | 625 |
| DOI: | 10.1587/transfun.E98.A.618 |
| 抄録: | In this paper, we present a new method for diagnosis of stochastic discrete event system. The method is based on anomaly detection for sequences. We call the method sequence profiling (SP). SP does not require any system models and any system-specific knowledge. The only information necessary for SP is event logs from the target system. Using event logs from the system in the normal situation, N-gram models are learned, where the N-gram model is used as approximation of the system behavior. Based on the N-gram model, the diagnoser estimates what kind of faults has occurred in the system, or may conclude that no faults occurs. Effectiveness of the proposed method is demonstrated by application to diagnosis of a multi-processor system. |
| Rights: | Copyright (C)2015 IEICE. Miwa Yoshimoto, Koichi Kobayashi, Kunihiko Hiraishi, IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, E98-A(2), 2015, 618-625. http://www.ieice.org/jpn/trans_online/ |
| URI: | http://hdl.handle.net/10119/12844 |
| 資料タイプ: | publisher |
| 出現コレクション: | b10-1. 雑誌掲載論文 (Journal Articles)
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このアイテムのファイル:
| ファイル |
記述 |
サイズ | 形式 |
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| 21507.pdf | | 1069Kb | Adobe PDF | 見る/開く |
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