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このアイテムの引用には次の識別子を使用してください: http://hdl.handle.net/10119/7799

タイトル: Efficient path delay test generation based on stuck-at test generation using checker circuitry
著者: Iwagaki, T.
Ohtake, S.
Kaneko, M.
Fujiwara, H.
発行日: 2007-11
出版者: Institute of Electrical and Electronics Engineers (IEEE)
誌名: IEEE/ACM International Conference on Computer-Aided Design, 2007. ICCAD 2007.
開始ページ: 418
終了ページ: 423
DOI: 10.1109/ICCAD.2007.4397301
抄録: This paper proposes an approach to non-robust and functionally sensitizable path delay test generation through stuck-at test generation. In this approach, to generate two-pattern tests for path delay faults in a combinational circuit, checker circuitry is constructed which is composed of logic gates corresponding to the mandatory assignments for detecting the faults. This checker circuitry allows us to use any existing combinational stuck-at test generation tool. Since today's stuck-at test generation tools reach a mature level, the proposed approach can efficiently solve the path delay test generation problem for combinational circuits. Experimental results show that the approach can speed up path delay test generation and can improve fault efficiency. This paper also discusses how a scan circuit and the issues of over-testing and test power are handled in the proposed test generation framework.
Rights: Copyright (C) 2007 IEEE. Reprinted from IEEE/ACM International Conference on Computer-Aided Design, 2007. ICCAD 2007. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of JAIST's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
URI: http://hdl.handle.net/10119/7799
資料タイプ: publisher
出現コレクション:b11-1. 会議発表論文・発表資料 (Conference Papers)

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