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このアイテムの引用には次の識別子を使用してください: http://hdl.handle.net/10119/7800

タイトル: Generation of Power-Constrained Scan Tests and Its Difficulty
著者: Iwagaki, T.
Ohtake, S.
キーワード: complete fault efficiency under a power budget
cone analysis
peak power
power-constrained test generation
scan circuit
発行日: 2007-12
出版者: Institute of Electrical and Electronics Engineers (IEEE)
誌名: 2007 2nd International Design and Test Workshop
開始ページ: 71
終了ページ: 76
DOI: 10.1109/IDT.2007.4437432
抄録: This paper proposes a test generation framework to generate stuck-at tests for a scan circuit under both peak shift and capture power limits. A concept of "complete fault efficiency under a power budget" is introduced, and it is pointed out that existing test-generation-based techniques for test power lack this completeness. Some analytical data obtained by using the proposed framework are presented to show the difficulty of generating test patterns that meet given limits for shift-in, shift-out and capture power, simultaneously. To relax the difficulty, this paper also describes a heuristic procedure using a cone analysis that definitely derives scan tests with low shift-in power and that reduces the search space during test generation. From the point of view discussed in this paper, further work should be undertaken in the future.
Rights: Copyright (C) 2007 IEEE. Reprinted from 2007 2nd International Design and Test Workshop. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of JAIST's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
URI: http://hdl.handle.net/10119/7800
資料タイプ: publisher
出現コレクション:b11-1. 会議発表論文・発表資料 (Conference Papers)

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