|
|
JAIST Repository >
著者: "Fujiwara, Hideo"
4 著者名表示.
| 発行日 | タイトル |
著者 |
|---|
| 1-Dec-2003 | 不連続再収斂順序回路の遅延故障に対するテスト生成法 | 岩垣, 剛; 大竹, 哲史; 藤原, 秀雄; IWAGAKI, Tsuyoshi; OHTAKE, Satoshi; FUJIWARA, Hideo |
| 1-Dec-2004 | A Design Scheme for Delay Testing of Controllers Using State Transition Information | IWAGAKI, Tsuyoshi; OHTAKE, Satoshi; FUJIWARA, Hideo |
| Dec-2005 | Efficient Constraint Extraction for Template-Based Processor Self-Test Generation | Kambe, Kazuko; Iwagaki, Tsuyoshi; Inoue, Michiko; Fujiwara, Hideo |
| 1-Jun-2006 | A Low Power Deterministic Test Using Scan Chain Disable Technique | YOU, Zhiqiang; IWAGAKI, Tsuyoshi; INOUE, Michiko; FUJIWARA, Hideo |
|
