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著者:  "Tomitori, Masahiko"

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16 著者名表示.

発行日タイトル 著者
1996 超高真空STMで安定な原子像を得るためには?-試作と実験のノウハウ (II)-富取, 正彦; Tomitori, Masahiko
May-1996 超高真空STMで安定な原子像を得るためには?-試作と実験のノウハウ (I)-富取, 正彦; Tomitori, Masahiko
Jul-2004 Germanium nanostructures on silicon observed by scanning probe microscopyTomitori, Masahiko; Arai, Toyoko
8-Feb-2005 A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probeArai, Toyoko; Tomitori, Masahiko
25-Apr-2006 Evidence of temperature dependence of initial adsorption sites of Ge atoms on Si(111)-7x7Ansari, Zubaida A.; Tomitori, Masahiko; Arai, Toyoko
2008 走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用富取, 正彦; 新井, 豊子; Tomitori, Masahiko; Arai, Toyoko
28-May-2010 Frequency modulation atomic force microscope observation of TiO_2(110) surfaces in waterSasahara, Akira; Tomitori, Masahiko
4-Jun-2012 電圧印加非接触原子間力顕微鏡/分光法による固体表面間の結合形成過程の解析富取, 正彦; Tomitori, Masahiko
3-Jun-2013 複合顕微鏡による高温下でのナノ接点・接合形成のその場観察・解析富取, 正彦; Tomitori, Masahiko
13-Aug-2013 Electrochemical etching of metal wires in low-stress electric contact using a liquid metal electrode to fabricate tips for scanning tunneling microscopyNishimura, Takashi; Amer Hassan, Amer Mahmoud; Tomitori, Masahiko
23-Jul-2014 Stable alignment of 4,4″-diamino-p-terphenyl chemically adsorbed on a Si(001)-(2 × 1) surface observed by scanning tunneling microscopyAmer Hassan, Amer Mahmoud; Nishimura, Takashi; Sasahara, Akira; Murata, Hideyuki; Tomitori, Masahiko
30-Jul-2014 Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopyOoe, Hiroaki; Sakuishi, Tatsuya; Nogami, Makoto; Tomitori, Masahiko; Arai, Toyoko
3-Jun-2016 走査型プローブ顕微鏡技術を利用したナノ接合界面の形成と解析富取, 正彦; Tomitori, Masahiko
2-Jun-2017 走査型プローブ顕微鏡を応用した固体表面上1分子の電荷状態変化の測定富取, 正彦; Tomitori, Masahiko
22-Jun-2017 Quasi-stabilized hydration layers on muscovite mica under a thin water film grown from humid airArai, Toyoko; Sato, Kohei; Iida, Asuka; Tomitori, Masahiko
19-Mar-2018 Energy dissipation unveils atomic displacement in the noncontact atomic force microscopy imaging of Si(111)-(7×7)Arai, Toyoko; Inamura, Ryo; Kura, Daiki; Tomitori, Masahiko

 


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